Structural and morphological investigation of bulk heterojunction blend (NiPc/C60) Thin films under heat treatment

  • Atheer M. Mkhaiber Department of Physics, College of Science, University of Baghdad, Baghdad, Iraq
  • Ameer F. Abdulameer Department of Physics, College of Science, University of Baghdad, Baghdad, Iraq
Keywords: Organic Semiconductors, NiPc/C60, XRD, Morphology, Structural properties and heat treatment

Abstract

Thin films of the blended solution of NiPc/C60 are fabricated using spin-coating method for three different ratios (100/1, 100/10 and 100/100) according to the weight. The films are deposited on to glass substrates and treated with several annealing temperatures (373, 423 and 473)K. The structure and surface morphology of the as-deposited and annealed films using x-ray diffraction and AFM was studied and exhibited a change and enhanced crystallization and surface morphology caused by changes in heat treatment temperatures. Investigation of X-ray diffraction patterns of NiPc/C60 indicated that it have polymorphism structure, i.e. mix between amorphous and polycrystalline structure. when heat treatment temperatures changed, led to the ?-crystalline films oriented preferentially to the (100) plane. The grain size of the blend (NiPc/C60) thin film is calculated using the Scherrer relation and the variation was nonsystematic with increased annealing temperature. AFM measurements supported the result of XRD.

Published
2018-10-31
How to Cite
MkhaiberA. M., & AbdulameerA. F. (2018). Structural and morphological investigation of bulk heterojunction blend (NiPc/C60) Thin films under heat treatment. Iraqi Journal of Science, 59(4A), 1847-1857. Retrieved from http://scbaghdad.edu.iq/eijs/index.php/eijs/article/view/380
Section
Physics