Structural and morphological investigation of bulk heterojunction blend (NiPc/C60) Thin films under heat treatment

  • Atheer M. Mkhaiber Department of Physics, College of Science, University of Baghdad, Baghdad, Iraq
  • Ameer F. Abdulameer Department of Physics, College of Science, University of Baghdad, Baghdad, Iraq

Abstract

Thin films of the blended solution of NiPc/C60 are fabricated using spin-coating method for three different ratios (100/1, 100/10 and 100/100) according to the weight. The films are deposited on to glass substrates and treated with several annealing temperatures (373, 423 and 473)K. The structure and surface morphology of the as-deposited and annealed films using x-ray diffraction and AFM was studied and exhibited a change and enhanced crystallization and surface morphology caused by changes in heat treatment temperatures. Investigation of X-ray diffraction patterns of NiPc/C60 indicated that it have polymorphism structure, i.e. mix between amorphous and polycrystalline structure. when heat treatment temperatures changed, led to the α-crystalline films oriented preferentially to the (100) plane. The grain size of the blend (NiPc/C60) thin film is calculated using the Scherrer relation and the variation was nonsystematic with increased annealing temperature. AFM measurements supported the result of XRD.

Published
Oct 31, 2018
How to Cite
MKHAIBER, Atheer M.; ABDULAMEER, Ameer F.. Structural and morphological investigation of bulk heterojunction blend (NiPc/C60) Thin films under heat treatment. Iraqi Journal of Science, [S.l.], p. 1847-1857, oct. 2018. ISSN 2312-1637. Available at: <http://scbaghdad.edu.iq/eijs/index.php/eijs/article/view/380>. Date accessed: 12 nov. 2018.
Section
Physics